News and Announcements

This issue (linked here) includes the following: Feature by Neelam Nakadi: Fit a univariate distribution to the data using R --- ​​​Fitting a statistical distribution to the given data is a bit of an iterative process. When we know the distribution of a data set, we can set some expectations for characterizing a dataset before we actually apply a ... more
Posted by Mindy Hotchkiss on Statistics Division Mar 16, 2023 12:18 PM CDT
The 65th Annual ASA/ASQ Fall Technical Conference (FTC) will be held in Raleigh, NC, on October 4-6, 2023. Call for Abstracts deadline is Feb 28th: https://my.asq.org/communities/files/177/11661 The Fall Technical Conference has long been a forum for both statistics and quality, and is co-sponsored by the American Society for Quality (Chemical ... more
Posted by Mindy Hotchkiss on Statistics Division Feb 24, 2023 11:40 AM CST
Ellis R. Ott Scholarship for Applied Statistics and Quality Management Deadline: April 1 For more information about the program and last year's winners, see Ellis R. Ott Scholarship Provides $7,500 to ‘Quality’ Students | Amstat News . Criteria for Selection - Applicants must be students planning to enroll or currently enrolled in a Master's degree ... more
Posted by Mindy Hotchkiss on Statistics Division Jan 4, 2023 11:48 AM CST
This issue (linked here or download below) includes the following: · Mini Paper by Lynne B. Hare - Designing for Product and Process Robustness · Feature by Rucha Deshpande - SIMCA: Soft Independent Modeling of Class Analogies · Ellis R. Ott Scholarship Awardees for the Academic Year, 2022-23 · Memories of Gordon Clark (1934 – 2022) by Doug Hlavacek · ... more
Posted by Geoff Farmer on Statistics Division Oct 31, 2022 3:08 PM CDT
This issue includes the following: · Comparing Three Approaches to Robust Design by Dr. Wayne Taylor · Feature by Neelam Nakadi: Examine the Distribution of Data using R Graphs · Columns by Donald J. Wheeler, guest author Grant Reinman, and Jim Frost. Comparing Three Approaches to Robust Design: Key Words: Robust Design, Parameter Design, Dual ... more
Posted by Geoff Farmer on Statistics Division Oct 31, 2022 3:00 PM CDT