2020 Feb Vol 39 No 1
TABLE OF CONTENTS
Chair Message - Amy Ruiz
Past Chair Message - Mindy Hotchkiss
Editor's Corner - Harish Jose
Youden Address "The Role of DEX & EDA for Standards & the Role of Standards for DEX & EDA Part 1: The Youden
Years." - James Filliben

Columns
Statistical Process Control "Gauge R&R Methods Compared: How do the ANOVA, AIAG, and EMP approaches differ?" - Don Wheeler
Hypothesis Testing "Low Power Tests Exaggerate Effect Sizes" - Jim Frost
Risk and Uncertainty "Wearout and Early Type Failure Modes, Reliability and Risk" - Steven Luko